Nanostructural characterisation – Department for the Synthesis of Materials (K8)

Researchers:

Sašo Gyergyek

Nina Križaj

Coordinator: Darko Makovec

Advanced electron microscopy (C_s-probe corrected STEM) in combination with other methods (XRD, Raman, magnetic/electrical measurements) for nanostructural characterization

Selected papers: 10.1039/D2NR00307D, 10.1039/D0CE01111H, 10.1039/C7NR05894B, 10.1039/C8NR03815E, 10.1016/j.actamat.2019.04.050

Atomic-resolution HAADF / BF imaging

EDXS (quantitative) elemental analysis, elemental mapping

EELS (quantitative) analysis, Energy Loss Near Edge Structure (ELNES), atomic resolution elemental mapping