Nanostructural Characterisation

Advanced electron microscopy techniques are combined with complementary methods, including X-ray diffraction (XRD), Raman spectroscopy, and magnetic/electrical measurements, for the (nano)structural characterization of materials. The core expertise of the group is aberration-corrected scanning transmission electron microscopy (STEM; JEOL ARM 200CF and Thermo Fisher Scientific Spectra 300), a powerful technique that enables the combination of atomic-resolution imaging (BF/HAADF/iDPC) with chemical analysis using EDXS and EELS.